Temperature Dependence of Hot-Electron Graphene Fet Bolometric Detectors Response to Modulated Terahertz Radiation

Abstract

In this paper, we analyze the modulation characteristics and the ultimate modulation frequency of the terahertz (THz) hot-electron FET bolometers with the graphene channels (GCs), metal gate (MG), and gate barrier layers (BLs) in a wide temperature range. Our results predict that the responsivity of GC-FET bolometers decreases with decreasing operating temperature. This is attributed to a dramatic drop in the thermionic GC-MG current (characterized by the relatively large activation energy) and its modulated component when the temperature lowers. A further decrease in the temperature results in a fairly strong responsivity roll-off. In contrast, the responsivity of the GC-FET detectors with the temperature-adjusted load resistance rises with decreasing temperature because the temperature lowering leads to an increase in the electron energy relaxation time and promotes more effective heating by the impinging THz radiation. In this case, the weakening of the thermionic current is compensated by the commensurate increase in the load resistance.