Temperature dependence of holographic recording in 15 nm As 2S 3 film

Abstract

The chalcogenide As–S glass films are very attractive for holographic grating preparation because of their large photo-induced optical changes. The minimal thickness of the films for homogeneous (plane) wave recording, is experimentally determined to be 50 nm. The recording in a 15 nm thick As 2S 3 film is achieved using a surface-propagating inhomogeneous evanescent reference wave. We show 10% diffraction efficiency decreasing due to a heating up to 78°C of the previously recorded room temperature grating. No such change has been observed for the grating, recorded in a preliminary heated As 2S 3 film.