Abstract

The authors investigated the temperature dependence of Hall effects on polycrystalline pentacene thin-film transistors manufactured on plastic base films. The temperature dependence of the charge amounts evaluated from the Hall effect measurements is systematically compared with that evaluated from capacitance-voltage (CV) measurements. Our result indicates that the conduction carriers are dominated by hopping between polycrystalline grain boundaries below 260K and tend to be delocalized above 260K.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call