Abstract
We present experimental investigations on the ac Josephson effect in Nb/InAs/Nb Josephson junctions. We find oscillatory behavior of both Shapiro and Fiske step widths as a function of irradiated power and, furthermore, oscillations of Shapiro step widths with temperature. The measured temperature and power dependencies of Shapiro and Fiske step widths are well described by adapted resistively and capacitively shunted junction models accounting for excess currents and a nonuniform current distribution, respectively.
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