Abstract
The temperature- and field-dependent degradation properties of bulk Pb(Zr,Ti)O 3 material (PZT) under a unipolar electric field were investigated. Unipolar cycling leads to the build-up of an internal bias field based on the agglomeration of charges at grain boundaries. A simple model was developed which describes the general dynamics of unipolar fatigue and its dependence on temperature and driving field. Comparing the large and small signal permittivity before and after fatigue led to the conclusion that domain walls became clamped by the agglomerated charges. This clamping effect could be visualized by transmission electron microscopy (TEM). Additionally, the TEM investigations revealed that unipolar fatigue leads to a weakening of the microstructure and to the development of microcracks.
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