Abstract
Abstract For the comprehensive characterization of nanoparticles cross-sectional investigation on the atomic scale by analytical and high-resolution transmission electron microscopy (TEM) is indispensable. Cross-sectioning is especially important for anisotropic nanoparticles to gain information on structure and chemistry along all important projections. We present a focused ion beam (FIB) method for site- and orientation-specific cross-sectioning of arbitrary nanoparticles that are dispersed on a substrate. By adopting a shadow geometry originally developed for thin sensitive films' protection of the specimen by a platinum layer is avoided. This enables simultaneous observation (from the front side) by the electron beam and ion-beam sectioning (from the back side of the supporting substrate) of individually selected particles with excellent accuracy on the nanometer scale. The feasibility and general applicability of the method is demonstrated by site-specific sectioning and cross-section HRTEM investigation of two types of anisotropic nanostructures: silver nanorods with five-fold twin structure and Janus-type silver patchy particles.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
