Technology-driven limits on DVFS controllability of multiple voltage-frequency island designs

Abstract

In this paper, we consider the case of network-on-chip (NoC) based multiple-processor systems-on-chip (MPSoCs) implemented using multiple voltage and frequency islands (VFIs) that rely on fine-grained dynamic voltage and frequency scaling (DVFS) for run-time control of the system power dissipation. Specifically, we present a framework to compute theoretical bounds on the performance of DVFS controllers for such systems under the impact of three important technology driven constraints: (i) reliability and temperature driven upper limits on the maximum supply voltage; (ii) inductive noise driven constraints on the maximum rate of change of voltage/frequency; and (iii) increasing manufacturing process variations. Our experimental results show that, for the benchmarks considered, any DVFS control algorithm will lose up to 87% performance, measured in terms of the number of steps required to reach a reference steady state, in the presence of maximum frequency and maximum frequency increment constraints. In addition, increasing process variations can lead to up to 60% of fabricated chips being unable to meet the specified DVFS control specifications, irrespective of the DVFS algorithm used.