Abstract
The waveguide-resonance mechanism of X-ray beam propagation and a design for a planar waveguide resonator based on this mechanism are briefly described. Principal attention is concentrated on estimating the admissible nonparallelism of reflectors in the waveguide-resonance channel and on revealing its effects. Practical recommendations are given for adjusting the waveguide resonator used in the X-ray optical scheme of diffractometers. The parameters of beams formed by waveguide resonators and cutoff-slit systems are compared.
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