Abstract
The extended spectral ray method (ESRM) is employed in deriving expressions for the multiply diffracted fields by a pair of semi-infinite parallel material sheets/layers. One of the sheets is chosen to satisfy a second order boundary condition simulating a thin dielectric layer and the other is a resistive sheet. Of interest is the computation of the leading edge scattering given as the sum of the singly and multiply diffracted fields with particular attention given to the computation of higher order diffraction fields beyond the second. Their evaluation required a non-traditional approach and up to fifth order diffraction fields are derived and applied in computing the scattering by a pair of half sheets simulating a metal-backed dielectric half plane as thin as 1/20 of a wavelength. Numerical results for other practical simulations are presented and compared with results based on alternative computational methods, where applicable.
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