Abstract
The development of the automated thermal test lab (TATTL) at Advanced Micro Devices originated in the need to improve the efficiency and resource utilization for the thermal characterization services provided by the Materials Research Laboratory. TATTL is a set of Fortran-77 real-time data acquisition and control modules which integrate the variety of instrumentation required for the performance of device calibration and junction-to-case thermal resistance, natural-convection, and forced-convection testing. The TATTL modules provided a complete environment within which thermal testing is performed and they are built on a central database unifying the information needed during testing and subsequent reporting of results. The architecture of the TATTL system and the hardware and software used in this implementation are described. Communication with instrumentation, operation in a real-time environment, and structuring of data for efficient transfer and report generation are discussed. The software runs on a DEC QBUS system, but in this discussion, emphasis is placed on the system structure rather than the details of coding. >
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
