Abstract
The wide matrix rocking curves of the in situ eutectic composite TaSi2-Si make it attractive as a wide-bandpass monochromator for synchrotron radiation. Wafers with Si[111], Si[110], or Si[100] orientation were studied to determine the origin of the wide rocking curves. The high degree of preferred orientation of the TaSi2 rods relative to the Si matrix was examined using synchrotron Laue patterns and the TaSi2 [100], TaSi2 [003], and TaSi2 [102] reflections. Double and triple axis diffractometry were used to show that the large widths were due to strain and mosaic and not long-range bending; copper radiation (for some double axis results) and 120 and 160 keV synchrotron radiation were used. At 8 keV, rocking curve widths were about twenty times broader than those from perfect Si, and peak reflectivities approached 20%. Rocking curves from Si[333] and Si[444] (120 and 160 keV, respectively) had identical profiles and reflectivities of about 25%. The triple axis results show compressive strains in the Si matrix along Si[111] (i.e., parallel to the rods) and dilational strains orthogonal to the rods. These results confirm the promise of TaSi2-Si as a wide-bandpass optical element for synchrotron radiation.
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