Target dependence of multi-electron processes in Iq+ (q=10, 15)+rare gas (Ne, Ar, Kr and Xe) collisions

Abstract

We have determined experimentally the absolute cross sections for i-electron capture (to projectile) and j-electron removal (from target) ( sigma q,q-ij), total electron capture ( sigma q= Sigma i sigma q,q-i), j-electron removal ( sigma qj= Sigma i sigma q,q-ij) and i-electron capture ( sigma q,q-i= Sigma j sigma q,q-ij) for the processes: Iq+(q=10 or 15)+B to I(q-i)++Bj++(j-i)e (B identical to Ne, Ar, Kr and Xe) at collision energy of 1.5q keV. Charge-state distributions of the scattered ions were measured in coincidence with the recoil ions. The absolute electron-capture cross sections were measured by the initial growth-rate method. The experimental results for sigma q and sigma qj were compared with the predictions of the extended classical over-barrier model (ECBM). The branching ratios of the multiply-excited ions produced by multi-electron transfer have also been determined.