Abstract

A novel and general chemical solution route for processing high-quality transition metal and rare-earth orthorhombic manganite thin films on Pt(111)/Ti/SiO2/Si substrates was reported. The precursor solutions decomposition process of the manganites was studied by TG and DTA techniques, showing the formation of the phase above 650°C in LaMnO3 and 750°C in both EuMnO3 and DyMnO3 thin films. X-ray diffraction and Raman spectroscopic analysis reveal the formation of a pure orthorhombic structure, with a space group Pbnm, in LaMnO3, EuMnO3 and DyMnO3 thin films annealed at temperatures above the TG phase formation temperature observed. Microstructure and grain morphology of the films were analyzed by SEM and AFM techniques, showing a progressive improvement of the films structures with the increase of the annealing temperature. The temperature dependence of the magnetic response of the LaMnO3, EuMnO3 and DyMnO3 thin films show typical transition temperatures, compared with those reported for lanthanum, europium and dysprosium manganite single crystals and ceramics.

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