Abstract

The synthesis of Ti3C2 MXene through etching of Ti3AlC2 MAX phase in NH4F-HCl solution was studied. The products of etching were investigated by the X-ray diffraction phase analysis. The elementary lattice parameter of MXene determined from X-ray data is equal to 24.0 Å. Prolonged treatment time results in decrease in the intensity of (002) reflections of MXene phase, possibly due to the delamination processes.

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