Abstract

Boron-doped polycrystalline silicon film was synthesized using hot wire chemical vapor deposition technique for possible application in photonics devices. To investigate the effect of substrate, we considered Si/SiO2, glass/ITO/TiO2, Al2O3, and nickel tungsten alloy strip for the growth of polycrystalline silicon films. Scanning electron microscopy, optical reflectance, optical transmittance, X-ray diffraction, and I-V measurements were used to characterize the silicon films. The resistivity of the film was 1.3 × 10−2 Ω-cm for the polycrystalline silicon film, which was suitable for using as a window layer in a solar cell. These films have potential uses in making photodiode and photosensing devices.

Highlights

  • Hydrogenated intrinsic polysilicon film can reduce the cost of optoelectronics device significantly

  • We described the growth, optimization, and characterization of boron-doped polycrystalline silicon films synthesized using hot wire chemical vapor deposition (HWCVD)

  • The HWCVD system used in this work [11] was custom made of stainless steel with provision of a window for monitoring the tungsten filament temperature

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Summary

Introduction

Hydrogenated intrinsic polysilicon film can reduce the cost of optoelectronics device significantly. The prospects of intrinsic polysilicon films for thin-film solar cell and other optoelectronic device fabrication using hot wire chemical vapor deposition (HWCVD) were well evaluated [1]. Boron-doped highly conducting 0.08 (Ωcm)−1 polycrystalline silicon films were optimized using. Thin-film solar cell fabricated on plastic substrate at 150 ◦ C showed the prospect of these films as a cost-effective solution [5]. We described the growth, optimization, and characterization of boron-doped polycrystalline silicon films synthesized using HWCVD. A range of experiments were conducted by varying the growth conditions to optimize the crystalline quality of silicon film with an intention to use the film in a solar cell [9,10]. We conducted experiments for the synthesis of p-type polycrystalline silicon layers on a variety of substrates

HWCVD System Used for Synthesis and Other Apparatus
Growth of Boron-Doped Polycrystalline Silicon Film
SEM Image Analysis
SEM image analysis
Crystal Orientation
Optical Transmission and Reflectance
Interference
Resistivity
Conclusions
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