Abstract

Copper Indium disulfide (CIS) thin films were synthesized by chemical solution deposition method on glass substrates. Low processing temperatures of 420 °C under nitrogen annealing is key feature of this study.CIS thin films on glass were prepared by dissolving copper (II) chloride, Indium (III) chloride and Thiourea in 2-methoxy ethanol. Surface structures and morphology of the synthesized CIS thin films studied by grazing incidence X-ray diffraction and atomic force microscopy, respectively, revealed a phase pure growth and smooth morphology with average crystallite sizes of the order of 2.97 nm. Hall Effect study demonstrates that synthesized CIS thin film is p-type with holes as majority charge carriers. Temperature dependence of optical band gap was studied in the wavelength range of 200-1400 nm and was found to decrease with increasing temperature. Detailed results on synthesis and physical properties will be presented

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