Abstract
We have used the method of solution casting for producing thin films of PMMA with SiO2 and ZnO composite, with various concentration of the dopant ZnO and SiO2 nanoparticles (NPs) (0.5 wt%, 1 wt% and 2 wt%). In order to prepare the sample, we used a 50µm thick PMMA/ZnO/SiO2 composite thin films (PZSCTFs), while keeping the concentration of SiO2 nanoparticles (NPs) constant at 0.5 wt% the concentration of ZnO (NPs )was varied as 0.5 wt%, 1 wt% and 2 wt% . Further for preparing next specimen just the concentrations of ZnO and SiO2 NPs were reversed. The high peaks of XRD displays the high grade purity of ZnO NPs and amorphous nature of SiO2 NPs. SEM results show that SiO2 is in cluster form and has size below 20nm whereas the ZnO NPs are non-spherical rod like particles of size in range 260nm to 400nm. The outcomes of optical properties shows that the absorption, absorption coefficient, extinction coefficient, reflectance, refractive index, optical conductivity, real and imaginary dielectric constants are directly proportional to the NPs. Whereas the properties like energy bandgap is inversely proportional to the NPs, and for high concentration of ZnO NPs they have a tendency to decrease more. The radiation shielding properties show that PZSCTFs film improved the gamma and UV–radiation shielding ability, are directly proportional to the concentration of NPs and have an greater increasing tendency for high concentration of SiO2 NPs. Dispersion of NPs in PMMA matrix supported to increase the radiation shielding.
Published Version
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