Abstract
We numerically demonstrate and analyze polarization chaos synchronization between two free-running vertical cavity surface emitting semiconductor lasers (VCSELs) in the mutual coupling configuration under two scenarios: parallel injection and orthogonal injection. Specifically, we investigate the effect of external parameters (the bias current, frequency detuning and coupling coefficient) and internal parameters (the linewidth enhancement factor, spin-flip relaxation rate, field decay rate, carrier decay rate, birefringence and dichroism) on the synchronization quality. Finally simulation results confirm that in the parallel injection, chaotic synchronization can reach a cross-correlation coefficient of 0.99 within a range of parameter mismatch ±12%. On the other hand, the chaos synchronization for orthogonal injection only reaches a cross-correlation coefficient of 0.95 within a range of parameter mismatch ±3%.
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