Abstract
Precise measurements of the transverse beam parameters are essential to control and optimize all types of charged particle beams. In this paper we present a novel method that uses one quadrupole magnet and one profile monitor to measure the transverse beam emittance and optics. In comparison to a conventional single-quadrupole scan measurement, this new technique measures the two transverse planes simultaneously. This novel procedure is faster, more intuitive and allows keeping under control the required quadrupole gradient and the beam sizes at the profile monitor. The application of the method is illustrated with the SwissFEL Injector Test Facility.
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