Abstract
We demonstrate the design, fabrication, and measurement of a switchable distributed Bragg reflector (DBR) that can be thermally switched from a close-to-zero reflective OFF state to a more than 70% reflection in its ON state. This is accomplished using a multilayer thin film stack using germanium (Ge) and the phase change material (PCM) Ge2Sb2Te5 (GST). The refractive indexes of Ge and GST in the amorphous state are closely matched, resulting in a nearly zero interface reflection. With appropriate antireflection coatings at the cavity ends, the overall reflection can be designed to be close to zero. When the GST is switched to the crystalline state, the refractive index contrast between the Ge and GST layers will increase dramatically contributing to the DBR reflection. Using this unique feature, we were able to design and experimentally demonstrate more than 70% reflection in the ON state and close to zero reflection in the OFF state at a wavelength of 2 µm.
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