Abstract
A 4-nm-thick alloy film with a metal composition close to AISI 304 stainless steel, deposited on a multilayer, was investigated by Jörg Zegenhagen and co-workers (article number 2000055) as a model of the stainless-steel surface region crucial for pitting corrosion. Using the X-ray standing wave method, the oxidation states of iron, chrome and nickel as well as film composition and changes after electrolyte exposure are resolved depth-selectively. Hydrogen loading by exposure to 0.1 M KCl at cathodic potential leads to swelling of the film by 11%, thus decreasing the resistance to pitting corrosion and finally leading to embrittlement.
Highlights
An %4 nm FeCrNi film, deposited on a Ru/B4C multilayer (ML), is used to study cathodic hydrogen charging in electrolyte
The findings presented here shed new light on reports that hydrogen loading decreases the resistance of stainless steel (SS) to pitting corrosion,[3,16,27,28,29,30] leading to embrittlement.[4,5,6]
An %4 nm-thick FeCrNi film with a metal composition close to SS 304 was used to study structural changes induced by electrolytic hydrogen charging at cathodic potential
Summary
An XSW is created during Bragg reflection. Its planes move inward by 1.85 nm, i.e., by half the d-spacing of the ML[20,31,32] (Figure 1a) when crossing the range of reflection. Qffiffiffiffiffiffiffiffiffiffiffiffi YðEγÞ 1⁄4 IðEγÞ=I0 1⁄4 1 þ RðEγÞ þ 2 RðEγÞFc cos1⁄2vðEγÞ À 2πPc In this case, YðEγÞ is the normalized X-ray fluorescence yield of Cr, Fe, or Ni, recorded when traversing the Bragg reflection. Traversing the rocking curve, the XSW maxima move inward by half the wavefield spacing dML from P 1⁄4 0.5 via 0.25 to P 1⁄4 0/1 and the mimima move from P 1⁄4 0/1 via 0.75 to P 1⁄4 0.5. Www.pss-b.com distribution around this mean position[20,31] (see Supporting Information for more details) Both parameters are defined on a scale from 0 to 1, with Fc 1⁄4 1 representing a delta-functionlike sharp distribution and Fc 1⁄4 0 describing a uniform distribution over the whole range of the wavefield spacing dML. Distances beyond dML cannot be determined without using additional information
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