Abstract
This paper presents a research on the susceptibility of a microcontroller against electrical fast transients (EFT) and the caused failure of the microcontroller. The susceptibility test method is based on an EFT injection probe. According to the result of test, it is found that the susceptibility threshold of coupling voltage is 25V and the tested IC was damaged due to latch-up effect. The results would be instructive for the IC application with better electromagnetic compatibility performance.
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