Abstract
Microprocessor and digital LSI technology used for process control in heavy industrial plant is subject to interference from electromagnetic (EM) radiation in the vicinity of these sites. This paper considers the tests that are necessary to demonstrate with some level of confidence that such equipment will not malfunction in the EM environment. Susceptibility failure mechanisms are analysed with reference to the transistor junction, the basic building block of modern electronics. The effects of system coupling are considered. Conducted susceptibility test methods include power injection, voltage injection and current injection. The application of these tests is discussed together with some alternative test methods and the ramifications for large system testing. Some minimum testing requirements are presented.
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