Abstract
A series of solvent cast poly(vinyl alcohol-co-vinyl acetate) (PVA/PVAc) copolymer films with PVAc concentrations ranging from 0% to 12% have been characterized with bulk nuclear magnetic resonance and surface [variable angle x-ray photoelectron spectroscopy (XPS) and time-of-flight (TOF) secondary ion mass spectroscopy (SIMS)] analytical techniques. PVAc was observed to preferentially segregate to the top most surface region, and despite variations in the bulk levels of PVAc the surface is composed of approximately 40% PVAc. The data suggests segregation is driven by the methyl groups of the acetate functionality and can be predicted based on the minimization of surface energy. TOF–SIMS data aided XPS peak assignments and observed minute manufacturing impurities (Na, K, Ca, and Si) undetected by XPS.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
