Surface structures on cleaved silicon by scanning tunnelling microscopy

Abstract

Scanning tunnelling microscopy observations on cleaved Si surfaces in ultra-high vacuum have revealed several new features. These include much deeper measured valleys between the 2 × 1 rows, and occurrences of chain bridging. The higher resolution surface profile data are readily compatible with the three-bond scission model but are difficult to reconcile with a modified Pandey chain model. Several surface structures are possible.