Abstract
The formation of surface alloys obtained by annealing ultra-thin films of Sn deposited on a Pd(111) surface was characterized by X-ray photoelectron spectroscopy (XPS), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD). Annealing the surface at 600 K produced a (3x3)R30° LEED pattern, and the comparison between experimental and theoretical XPD results indicated the formation of a corrugated bi-dimensional Pd2Sn surface alloy, with Sn atoms being present not only on the outmost layer but also at least on the second internal layer.
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