Abstract
The energy distribution of surface states within the conduction band has been determined analizing the mobility ratio μ H/μ eff. A shallow trap model was used to describe the surface states.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
