Abstract
It is shown that the x-ray magnetic linear dichroism (XMLD) in x-ray photoemission signal can be used to monitor the element specific magnetic moments in ultra thin alloy films. Comparison with recent superconducting quantum interference device data provides a quantitative check that demonstrates that the total magnetization derived from summing the constituent elemental moments changes with the composition of the alloy. This is illustrated by the contrasting behavior of FeNi and CoNi alloys.
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Schedule a callMore From: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
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