Abstract
We present a theoretical analysis of the effects of thickness on surface segregation in thin films. This theory predicts surface composition as a function of the heat of segregation, temperature and film thickness. The heat of segregation can be obtained from a bulk measurement. We then present atomistic simulation results for segregation in thin films of different thicknesses and at different temperatures. Our theoretical results show excellent correspondence with the atomistic simulation results for all film thicknesses with no adjustable parameters, other than the bulk heat of segregation. Extensions of the theory to describe multiple layer segregation are outlined.
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