Abstract
Surface roughness scattering is calculated for carriers in ellipsoidal energy bands. The purpose is to identify which dimension of the Fermi surface determines the degree of roughness which is required to produce diffuse reflection. It is concluded that the surface corrugations must be deep enough so that (kperpendicular to -kRperpendicular to ) xi 0 is comparable to unity, where xi 0 is the RMS bump height and kperpendicular to and kRperpendicular to are the initial wavevector and reflected wavevector in the sense defined by Price (1969).
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