Abstract
A statistical approach to simulation in behavioral modeling for assessing dynamic metrological performance during the concept design of accurate digitizers is proposed. A surface-response approach based on a statistical experimental design allows operating conditions to be systematically and comprehensively explored, simulation to be optimized, and identification and validation uncertainty to be verified. An actual case study on the dynamic metrological characterization of a fast digital integrator for high-performance magnetic measurements at the European Organization for Nuclear Research (CERN) is presented.
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