Abstract
A statistical behavioral modeling approach for assessing dynamic metrological performance during the concept design of accurate digitizers is proposed. A surface-response approach based on statistical experiment design is exploited in order to avoid unrealistic hypothesis of linearity, optimize simulation effort, explore systematically operating conditions, and verify identification and validation uncertainty. An actual case study on the dynamic metrological characterization of a fast digital integrator for high-performance magnetic measurements at European Organization for Nuclear Research (CERN) is presented.
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