Abstract
To clarify the interfacial properties of an organic light-emitting diode (OLED), we discuss the surface potential of organic semiconductor thin films fabricated on an electrode that was measured by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KFM) utilizing frequency modulation (FM). The organic semiconductor films were deposited on a glass/indium–tin-oxide (ITO) substrate by the vacuum evaporation technique using intersecting metal shadow masks. This deposition technique enables us to fabricate four different areas on the same substrate. The surface potentials of the crossover area of the deposited thin films were investigated by the nc-AFM/KFM technique. The energy band diagram was depicted, and we observed that the charge behavior of the organic semiconductor depended on the material and the structure.
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