Abstract
Infrared spectra of reflection and attenuated total reflection of PbTe thin films deposited by molecular beam epitaxy on a GaAs/CdTe substrate have been measured. The high-frequency dielectric constant, frequencies and oscillator strengths of transverse optical phonons, plasma frequencies, and plasma collision frequencies have been determined for all layers using the dispersion analysis. Attenuated total reflection spectra obtained with silicon and diamond prisms demonstrate surface phonon and plasmon–phonon polaritons. The dispersion curves of surface polaritons have been obtained.
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