Abstract
The optical properties of the layers formed when partially oxidized tin was evaporated in a vacuum are reported in this paper. After deposition of the films onto a quartz substrate, measurements of the IR reflectance, the dispersion curves of surface polaritons and the conductivity indicated that the film was a dielectric with a high refractive index. The dependence of the properties of such films on their deposition conditions was investigated. The influence of the films on the reflectance in the crystalline quartz restrahlen band was also studied.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
