Abstract
The most important thing in preparing thin films ceramic material such lead titanate, PbTiO3 is the behavioral of microstructural changes due to the applying heat treatment during crystallization process. In general, the imperfection of PbTiO3 surface morphology such as porosity, grain boundaries, existence of microcrack films, films out-diffusion and others are caused by this factor, heat transfer element and found very interesting to be discussed towards next electrical characterization. However, the present study only focuses on the surface morphology of PbTiO3 thin films that observed by both field emissions scanning electron microscopy (FESEM) and atomic force microscopy (AFM). The details of measurement for observation will be explained later. The preparation of PbTiO3 thin films were done trough simple sol-gel spin coating method deposited on ITO coated glass substrate.
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