Surface modes at negative index material film

Abstract

We have investigated the existence of surface modes at negative index material (NIM) film for the S-polarized. Our attention is mainly focused in the excitation of surface modes through numerical simulation technique of attenuated total reflection (ATR) and the manner in which the electric field is coupled into the film interfaces at NIM. In the case of the ATR show well defined minima originated by the coupling of the incident light with the symmetric and asymmetric modes. Frequencies at the minima are used to obtain the optical dispersion relations (ODR) as function of the filling factor in the unit cell (vacuum – LHM or LHM –vacuum – LHM). The ODR indicates the behavior of surface modes as the film thickness of the NIM is varied.