Abstract
The nature of surface enhancement in cold deposited silver films (CDF) is studied by means of reflected second harmonic (RSH) generation and scanning tunneling microscopy. A strong dependence of RSH radiation intensity, polarization and angular distribution on film mass thickness and temperature is observed. The surface enhancement vanishes irreversibly in CDF heated up to >220 K. Intercrystallite fractures (pores) are detected in the structure of annealed films. This residual porosity is interpreted as a result of self-diffusion healing of deeper fractures. The experimental results confirm that in CDF the surface enhancement has a ″classical ″ electromagnetic origin and is due to intercrystallite pores with sufficiently small values of the width/depth ratio. A simple theoretical model is proposed to estimate analytically the enhancement in structures such as deep narrow crevices.
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