Abstract
The morphology of poly(styrene-b-ethylene-r-butylene) (SEB) and poly(styrene-b-ethylene-r-butylene-b-styrene) (SEBS) thin films annealed both above (165 °C) and below (125 °C) the bulk order−order transition temperatures (OOT) (∼140 °C) was characterized with grazing incidence small-angle X-ray scattering (GISAXS), dynamic secondary ion mass spectrometry (d-SIMS), and atomic force microscopy (AFM). The SEBS thin film morphology is always spherical, regardless of film thickness or annealing temperature, leading us to conclude that the OOT for films up to five layers of spheres is depressed by at least 10 °C relative to the bulk. In contrast, the SEB film morphology at both 125 and 165 °C is always cylindrical, except when the film thickness is less than tcyl, a monolayer of cylinders. For SEB film thicknesses, t, less than tcyl at 165 °C either a partial or full monolayer of spheres forms (thickness tsph) with coexistence of patches of spheres and cylinders when tsph < t < tcyl. Thus, we conclude that the ...
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