Abstract
A discussion is given of principles and applications of surface extended X-ray absorption fine structure (SEXAFS) measurements of chemisorbed atoms on surfaces. The SEXAFS studies utilized synchrotron radiation in the 200–4000 eV spectral range and were carried out by means of either electron yield (i.e. Auger yield or total electron yield) or ion yield (selected desorbing adsorbate ions) detection. Such measurements are shown to provide complete structural information (distances, sites) for the surface chemisorption complexes if the polarized nature of synchrotron radiation is exploited. Surface structure determinations will be presented for selected chemisorption systems involving gas-solid reactions [i.e. S on Ni(100) and O on Mo(100)].
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