Abstract
A discussion is given of principles and analysis methods of the Extended X-ray Absorption Fine Structure (EXAFS) technique with emphasis on applications in surface crystallography. The various detection techniques in use such as transmission, fluorescence, electron yield and ion yield will be discussed and compared with respect to their applicability for surface studies. Analysis procedures of the EXAFS data will be outlined. Finally selected examples of surface structure investigations will be presented such as electron yield EXAFS studies of oxygen on Al (111) and ion yield EXAFS studies of oxygen on Mo(100).
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