Abstract
Outside surface fluctuations of inertial confinement fusion (ICF) capsule greatly affect the implosion performance. An atomic force microscope (AFM)-based profilometer is developed to precisely characterize the capsule surface with nanometer resolution. With the standard nine surface profiles and the complete coverage data, 1D and 2D power spectra are obtained to quantitatively qualify the capsule. Capsule center fast aligning, orbit traces automatic recording, 3D capsule orientation have been studied to improve the accuracy and efficiency of the profilometer.
Highlights
Due to Rayleigh–Taylor instability during inertial confinement fusion (ICF) experiment, the imperfection of capsule surface degrades the final symmetry of the implosion and creates mix at the pusher–fuel interface, potentially quench the ignition[1, 2]
An average fluctuation power spectrum for capsule surface was established as the National Ignition Facility (NIF) standard for acceptance of capsule surface quality[4]
Several key techniques, including capsule fast aligning to rotation axis, automatic recording of surface traces in one orbit, and 3D capsule orientation, have been developed to improve the functions of profilometer
Summary
Due to Rayleigh–Taylor instability during inertial confinement fusion (ICF) experiment, the imperfection of capsule surface degrades the final symmetry of the implosion and creates mix at the pusher–fuel interface, potentially quench the ignition[1, 2]. Our goal is to fabricate capsules with perfect surface through optimization of the process of fabrication. The optimization is based on precise measurement of capsules. The ability to precisely characterize the capsule surface is extremely important. In the 1990s, Lawrence Livermore National Laboratory (LLNL) and General Atomics (GA) developed an atomic force microscope (AFM)-based spheremapper, for mapping the outer surface profiles of ICF capsule[3]. Power spectrum became a significant parameter for capsule characterization. With the progress in capsule fabrication techniques and the increasing requirements for capsule precise characterization in ICF experiments, several surface analysis methods have been developed since 1999[5,6,7]. Optical inspection and white-light interferometer cannot detect localized defects or surface roughness less
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