Abstract
The surface analysis by laser ionization (SALI) technique has been applied to the chemical analysis of bulk solid polymer surfaces. Surface material was removed by a pulsed rare-gas ion probe beam at ∼7 keV and sputtered neutral molecules were photoionized by pulsed coherent radiation at 118 nm (10.5 eV) or 248 nm (5.0 eV). Photoions were then extracted into a reflecting time-of-flight mass spectrometer. The ion beam dose during analysis was kept below significant damage levels (<1013 primary ions/cm2), indicative of the very high sensitivity. The single-photon ionization (118 nm) resulted in much more extensive and representative mass spectra than for the multiphoton ionization, reflecting the fact that it is a relatively ‘‘soft’’ ionization technique. Very distinct and readily interpretable mass spectra are shown for poly(tetrafluoroethylene), the polyamide nylon 66, and poly(ethylene-glycol)-monostearate. Where comparison secondary ion mass spectra are available, these SALI spectra with one-photon ionization compare quite favorably.
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