Abstract
We have fabricated intrinsic Josephson junction array stack in a Bi2Sr2Ca2Cu3O10+δ (Bi-2223) single crystal whisker using three dimensional focused ion beam milling technique. We report measurements of current density depend on junctions array at 30 K upon the junction cross-sectional area S showing a strong suppression in critical current density for junctions with S≤1 µm2. We discussed quantum fluctuations of phase in submicron junctions which is a cause for suppression of critical current density.
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