Abstract
In this paper, a new method, which is based on reconstructing the original intensity distribution of a laser with images captured by a charge-coupled device (CCD) in two orthogonal directions, is proposed for suppressing the influence of CCD vertical blooming on the measurement of the laser beam quality factor (M2). A simplified theoretical model for the distribution of CCD blooming is also proposed. With the proposed method and model, the influence of CCD vertical blooming on the measurement of M2 is simulated. The experimental results demonstrate that the new method can be an effective means to measure the M2 of a near-infrared laser with a silicon CCD camera. The proposed method can be applied to a beam quality analyzer in order to suppress the influence of blooming on the measurement of M2.
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