Abstract

We report heat capacity measurements of confined films of4He. These studies were undertaken to test predictions of correlation-length scaling. They are the first measurements for completely confined films over a range of confinements, and represent a geometry where criticality changes from 3-dimensions (3D) to 2D. The finite system is realized with a4He film confined between two, 2″ diameter, silicon wafers, which are separated by a small gap. A new technique was developed to bond these wafers at a uniform separation. The gap size, which determines the film thickness, ranges from 0.05 to 0.7 μm in the present work, and has better than 1% uniformity. The bonded cells are used to conduct high precision heat capacity measurements using a modified ac technique. This involves oscillating the sample temperature, as in conventional ac calorimetry, but with simultaneous dc regulation of the average temperature. The data are analyzed using a modified Sullivan–Seidel equation, which takes into account in an empirical way the finite conductivity of the cell. This procedure yields heat capacity data with good absolute accuracy and high resolution. Scaling analysis of the data both above and below the bulk transition temperature shows collapse onto universal curves determined only by the ratio of the correlation length to the confinement size. This is true everywhere except near the heat capacity maximum. Here, and into the superfluid side there is lack of scaling which might be associated with 2D crossover. We compare this result with calculations of scaling functions and find that these tend to underestimate the effect of confinement. Comparison with earlier results for cylindrical confinement shows differences which are most striking in the region of the specific heat maximum. The cylindrical and planar confinement data follow similar trends above the superfluid transition of bulk helium. Below the transition, however, the present data show much more structure. Fits of the scaled planar data above the transition to an empirical scaling function yield a correlation length exponent of νeff=0.674±0.001.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call