Abstract
We have investigated the planarizing effects of multilayered superconducting thin films. Atomic force microscopy measurements indicate that coating a standard niobium base electrode with alternating layers of aluminum and niobium significantly reduces the film’s overall surface roughness. Planarized films such as these were used as the base electrodes of superconducting tunnel junctions that show vastly improved leakage characteristics over conventional junctions fabricated under the same conditions.
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