Abstract
Cube-textured Ag tapes of Ag{1 0 0} 〈0 0 1〉 were investigated to obtain in-plane aligned Re123 films, where Re represents Y, Gd, Sm and Nd by a continuous chemical vapor deposition technique. Y123 and Gd123 films formed on Ag{1 0 0} 〈0 0 1〉 tapes showed two types of the location, cube-on-cube and diagonal-on-cube, because of the lattice mis-fit between Ag and Y(Gd)123. On the other hand, Nd123 and Sm123 films formed at lower deposition temperature of 760°C indicated the good in-plane texturing. The in-plane aligning defined from the ratio of the (1 0 3) peak intensities by X-ray pole figure measurement was improved to 89% for Nd(Sm)123 films compared with 50% for Y(Gd)123 films.
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