Abstract
The weak-beam transmission electron microscopy imaging method was used to investigate the core structure of the [ 101 ] (111) dislocations in an Ni 3Ga single crystal predeformed at 20°C, 200°C and 400°C. Two different sessile configurations were identified, corresponding respectively to a very short-range cross-slip process and a long-range cross-slip process (Kear-Wilsdorf configuration) onto the (010) cube cross-slip plane. Both sessile configurations were observed to unlock by the reverse cross-slip process leading to their formation: the first at low and possibly high temperatures, and the second at high temperatures only.
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