Abstract
A thin film of lacunar lanthanum manganites La 0.8 MnO 3-δ has been epitaxially grown by injection chemical vapour deposition on a MgO (100) substrate. Transmission electronic microscopy and X-ray diffraction measurements were carried out on films before and after a thermal treatment at 700°C in air for 3 hours. Structural transformations were observed as a consequence of the annealing treatment: the as-deposited film which is almost single-phased, transforms into a mixing of two phases, and Mn octahedra become more regular, with significant increases of Mn-O-Mn bond angles close to 180°. The surprising feature developed in this paper concerns the MgO / La 0.8 MnO 3-( interface: a substrate deformation induced by the epitaxial film has been evidenced: MgO exhibits domains about 400 A thick from the interface with a cubic Fd3 lattice and a cell parameter twice this of normal MgO.
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